发明名称 EXPOSURE MASK, METHOD FOR FORMING RESIST PATTERN AND METHOD FOR FORMING THIN FILM PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide an exposure mask that can improve resolution. <P>SOLUTION: The exposure mask 10 has one slit type main transmitting region 1 and three sets of slit type sub-transmitting regions 2 arranged in series opposing to each other across the main transmitting region 1. By exposing and developing a resist film by using the exposure mask 10, the exposure width of the resist film is reduced because the light intensity contrast is enhanced at the end in the slit width direction of the main transmitting region 1 compared to a mask having at most two sets of sub-transmitting regions 2. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007219436(A) 申请公布日期 2007.08.30
申请号 JP20060042902 申请日期 2006.02.20
申请人 TDK CORP 发明人 UEJIMA SATOSHI;MATSUKUMA HIROKI
分类号 G03F1/29;G03F1/30;G03F1/68;G03F7/20;G11B5/31;H01L21/027;H01L43/08 主分类号 G03F1/29
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