发明名称 半導体装置
摘要 A transistor whose channel region includes an oxide semiconductor is used as a pull down transistor. The band gap of the oxide semiconductor is 2.0 eV or more, preferably 2.5 eV or more, more preferably 3.0 eV or more. Thus, hot carrier degradation in the transistor can be suppressed. Accordingly, the circuit size of the semiconductor device including the pull down transistor can be made small. Further, a gate of a pull up transistor is made to be in a floating state by switching of on/off of the transistor whose channel region includes an oxide semiconductor. Note that when the oxide semiconductor is highly purified, the off-state current of the transistor can be 1 aA/mum (1×10-18 A/mum) or less. Therefore, the drive capability of the semiconductor device can be improved.
申请公布号 JP6013706(B2) 申请公布日期 2016.10.25
申请号 JP20110031880 申请日期 2011.02.17
申请人 株式会社半導体エネルギー研究所 发明人 梅崎 敦司;木村 肇
分类号 G09G3/36;G02F1/133;G02F1/1368;G09F9/30;G09G3/20 主分类号 G09G3/36
代理机构 代理人
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