发明名称 |
LOOP-BACK PROBE TEST AND VERIFICATION METHOD |
摘要 |
A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, The method includes placing the first loop-back probe in electrical contact with the first conductive region, and placing the second loop-back probe in electrical contact with the second conductive region. Continuity between the substrate and the second conductive region is then measured. |
申请公布号 |
US2016377657(A1) |
申请公布日期 |
2016.12.29 |
申请号 |
US201615188024 |
申请日期 |
2016.06.21 |
申请人 |
Integrated Technology Corporation |
发明人 |
Schwartz Rodney E.;Geist John K. |
分类号 |
G01R1/073;G01R31/28 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
1. A method of using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, the method comprising:
placing the first loop-back probe in electrical contact with the first conductive region; placing the second loop-back probe in electrical contact with the second conductive region; and measuring continuity between the substrate and the second conductive region. |
地址 |
Tempe AZ US |