发明名称 ELECTRONIC DEVICE WITH ASYMMETRIC GATE STRAIN
摘要 The use of strained gate electrodes in integrated circuits results in a transistor having improved carrier mobility, improved drive characteristics, and reduced source drain junction leakage. The gate electrode strain can be obtained through non symmetric placement of stress inducing structures as part of the gate electrode.
申请公布号 US2016268428(A1) 申请公布日期 2016.09.15
申请号 US201615165951 申请日期 2016.05.26
申请人 Micron Technology, Inc. 发明人 Sandhu Gurtej S.;Parekh Kunal R.
分类号 H01L29/78;H01L29/40;H01L29/49 主分类号 H01L29/78
代理机构 代理人
主权项
地址 Boise ID US
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