| 摘要 |
An X-ray system tester for measuring a set of electrical signals comprising anode voltage, cathode voltage, anode current, filament current and line voltage produced by an X-ray system during the operation of such system. A selector is provided, which couples one of the electrical signals of the sets thereof produced or one of a plurality of processing control signals entered by an operator from a control panel, to a digitizing section, selectively in accordance with control signals provided to the selector by a computing section. The digitizing section converts the selected signal whether produced by the X-ray system or entered from the control panel, into a train of pulses having a frequency proportional to the value of the selected signal. The pulses in the pulse train are counted by a counter. The number of counts being used by the computing section to determine the frequency, and hence, the value of the selected signal. This computed value is stored in a computing memory section and the computing section which there selects a different one of the electrical signals for processing. The computing section is also adapted to store a plurality of the sets of electrical signals produced during a corresponding sequence of operational intervals of the X-ray system and determines a measure of the deviation of any selected one of the stored electrical signals over the sequence of operating intervals. The operator of the tester is able to recall from storage each one of the electrical signals produced during the sequential operational intervals to aid the operator in analyzing the operation of the X-ray system.
|
