发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To eliminate malfunction caused by variation in power source potential by detecting the level variation of data supplied to an output buffer part and interrupting the fetch of internal data to an output buffer part temporarily. CONSTITUTION:When the internal data Dout' varies in level, the voltage VDD or VSS of wiring 14 or 15 varies in potential. At this time, the level variation of the internal data Dout' is detected by a pulse generating circuit 16 to generate a pulse signal S. This signal S is inputted to an output buffer circuit 12. The output buffer circuit 12 holds last internal data Dout' by the input of this signal S and wrong data is inputted to the output buffer circuit 12 and never outputted from the integrated circuit even if outputted owing to the malfunction of a sense amplifier circuit 11 during a period wherein the voltage VDD or VSS of the wiring 14 or 15 varies in potential.
申请公布号 JPS63132521(A) 申请公布日期 1988.06.04
申请号 JP19860279943 申请日期 1986.11.25
申请人 TOSHIBA CORP 发明人 IWAHASHI HIROSHI
分类号 H03K5/00;G11C11/407;G11C11/409;H03K17/24;H03K19/00;H03K19/0185 主分类号 H03K5/00
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