发明名称 X-RAY INSPECTING DEVICE AND X-RAY INSPECTING METHOD
摘要 PURPOSE:To discriminate a subject even when a wiring is superposed on the subject, in X-ray inspection, and easily perform non-breakage inspection for a specified structure or defective part. CONSTITUTION:A memory for preliminarily calculating the ideal X-ray transmission intensity of a subject 4 by calculation and storing this is provided in an image processing part 6. In the image processing part 6, an X-ray transmitted image obtained by actually emitting X-ray to the subject 4 followed by measurement by use of an X-ray generator 1 and an X-ray detector 2, and an non- defective calculation image or removal calculation image are mutually compared or differentiated, whereby the image data of only the defective part of the subject 4 or the image data consisting of only a specified structure can be easily provided. Even when a wiring is superposed thereon, it can be easily discriminated.
申请公布号 JPH06118029(A) 申请公布日期 1994.04.28
申请号 JP19920269811 申请日期 1992.10.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TSUTSUI HIROSHI;OOTSUCHI TETSUO
分类号 A61B6/00;G01N23/04;G01T1/00;G01T1/24;H05K3/46 主分类号 A61B6/00
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