发明名称 |
MICROHARDNESS MEASURING TECHNIQUE FOR THIN METAL COATINGS |
摘要 |
FIELD: measurement technology. SUBSTANCE: measuring technique involves determining microhardness by size of recovered mark left by diamond indenter at two loads applied to the latter: 100 and 200 g. True value of microhardness is found from relationship between mentioned microhardness values. EFFECT: improved accuracy of evaluating true microhardness. 2 dwg, 1 tbl
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申请公布号 |
RU2132546(C1) |
申请公布日期 |
1999.06.27 |
申请号 |
RU19970114357 |
申请日期 |
1997.08.07 |
申请人 |
AKTSIONERNOE OBSHCHESTVO "AVTOVAZ" |
发明人 |
CHUMIKOV A.B.;ANIF'EV V.A. |
分类号 |
G01N3/44;(IPC1-7):G01N3/44 |
主分类号 |
G01N3/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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