发明名称 QUALITY INFORMATION ANALYSIS SUPPORT DEVICE, QUALITY INFORMATION ANALYSIS SUPPORT SYSTEM AND QUALITY INFORMATION ANALYSIS SUPPORT PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To provide a quality information analysis support device capable of rapidly improving parts quality by sharing parts quality information between an inspection section and a manufacturing section. SOLUTION: In this quality information analysis support device, quality information of parts at acceptance obtained by inspecting the parts at arrival, is recorded into an acceptance inspection result database 55 from a computer 3 in an inspection section, and quality information of parts in manufacture generated in manufacturing a product using the parts is recorded into the acceptance inspection result database 55 from a computer 4 in a manufacturing section. When there is access to the acceptance inspection result database 55, the quality information of parts at acceptance and the quality information of parts in manufacture are linked and displayed on display screens 3a, 4a.</p>
申请公布号 JP2003122817(A) 申请公布日期 2003.04.25
申请号 JP20010314267 申请日期 2001.10.11
申请人 RICOH CO LTD 发明人 FUJIWARA HITOSHI;YAMAGUCHI YASUHIRO;UMEDA HIDENORI;HORI SADAYOSHI
分类号 G05B19/418;G06Q50/00;G06Q50/04;(IPC1-7):G06F17/60 主分类号 G05B19/418
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