发明名称 Scanning probe microscope for imaging sample surface; has feedback loop to generate drive signal for controlling probe and imaging device that uses probe signal, drive signal and relation between two signals
摘要 The microscope has a measurement device (2,4,4a,4b,5,6,10,17) to generate a probe signal (Vc) according to interactions between a probe (1) and a sample (3) surface (3a). A control device (8) holds the interaction constant according to a drive signal (Vp) generated by a feedback loop between the measurement device and the control device. A memory device stores a relation between the probe and drive signals. A visualization device connected to the feedback loop, the measurement device and the memory device generates an image of the surface topography, through selective use of the probe signal, the drive signal, and the relation between the two. Independent claims are included for a method to control the microscope, a signal processing system and a method to control the signal processing system.
申请公布号 DE19956725(A1) 申请公布日期 2000.06.15
申请号 DE1999156725 申请日期 1999.11.25
申请人 NEC CORP., TOKIO/TOKYO 发明人 OOKUBO, NORIO;YUMOTO, SEIJI
分类号 G01B21/30;G01Q10/06;G01Q60/24;H01J37/28;(IPC1-7):G12B21/08 主分类号 G01B21/30
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