发明名称 |
FABRICATION METHOD OF CAPACITOR |
摘要 |
A fabrication method of capacitor is provided to improve capacitance of capacitor by forming a storage electrode along to the surface of bit line. The method comprises the steps of: sequentially forming a first insulator(20) and a flattening layer(8) on a substrate(1) having a transistor; forming a conductive layer(30) on the exposed active region(5) by selective etching the first insulator(20) and the flattening layer(8); forming a second insulator(11) and exposing a portion of another active region(5') by etching the first insulator(20); and forming a storage electrode(12) on the resultant structure. The storage electrode(12) is formed at both sidewalls of bit line, thereby increasing the effective surface area of the storage electrode.
|
申请公布号 |
KR0130454(B1) |
申请公布日期 |
1998.04.06 |
申请号 |
KR19930023468 |
申请日期 |
1993.11.05 |
申请人 |
HYUNDAI ELECTRONICS CO.,LTD |
发明人 |
PARK, SANG-HOON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|