发明名称 |
FORMATION OF FINE PATTERN |
摘要 |
PURPOSE:To prevent the deformation and swelling of a pattern and to enhance the resolution by applying a polymer contg. allyl groups to a substrate to form a resist film and rinsing the film with an ethylene glycol monoalkyl ether after exposure and development. CONSTITUTION:A negative type resist made of polymer such as polydiallyl o- phthalate contg. allyl groups in each repeating unit is applied to a substrate and prebaked to form a resist film. The film is then exposed through a prescribed pattern by irradiation, and after developing the resulting resist pattern the film is rinsed by dipping in an ethylene glycol monoalkyl ether such as ethylene glycol monomethyl ether and postbaked. Thus, the resolution of the pattern can be enhanced to about 1-0.5mum. |
申请公布号 |
JPS56155942(A) |
申请公布日期 |
1981.12.02 |
申请号 |
JP19800058601 |
申请日期 |
1980.05.06 |
申请人 |
FUJITSU LTD |
发明人 |
KITAMURA TATEO;YONEDA YASUHIRO;NAITOU JIROU;KITAKOUJI TOSHISUKE |
分类号 |
H01L21/30;G03F7/30;G03F7/32;H01L21/027 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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