发明名称 X-RAY ANALYZING APPARATUS
摘要 This x-ray analyzing apparatus is provided with a combination of the following: a first correction means (13A, 13B) that outputs a first gain that is for making the wave peak value of a target peak, which was estimated on the basis of the sum of a count rate found by preliminary measurement, match a prescribed expected wave peak value; and a second correction means (14A, 14B) that carries out feedback control in real time to output a second gain which is to be added to the first gain, and that performs such output to make a wave peak value of a target peak detected in a prescribed energy range match an expected wave peak value. In addition, the x-ray analyzing apparatus is provided with a feedback control stop means (16A, 16B) that accurately determines the presence or absence of an interference line with respect to a target peak, and in a case where it was determined that there is an interference line, sets the gain to a certain value consisting of the first gain.
申请公布号 WO2016043013(A8) 申请公布日期 2017.03.16
申请号 WO2015JP74270 申请日期 2015.08.27
申请人 RIGAKU CORPORATION 发明人 SAKO,Yukio
分类号 G01N23/223;G01N23/207;G01T1/17;G01T1/36 主分类号 G01N23/223
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