DUAL OUTPUT HIGH VOLTAGE ACTIVE PROBE WITH OUTPUT CLAMPING AND ASSOCIATED METHODS

摘要

A high-voltage active measurement probe is for a measurement instrument such as an oscilloscope. The high voltage active measurement probe includes an input terminal configured to receive an input signal from a device under test (DUT), a first output terminal configured to transmit a first output signal to the measurement instrument for measurement and display of peak voltages, and a second output terminal configured to transmit a second output signal to the measurement instrument for high sensitivity measurement and display of low level voltages. A first probe signal path is between the input terminal and the first output terminal, and a second probe signal path between the input terminal and the second output terminal. A first amplifier is in the first probe signal path between the input terminal and the first output terminal, and a second amplifier is in the second probe signal path between the input terminal and the second output terminal. A first attenuator is in the first probe signal path between the input terminal and the first amplifier, and a second attenuator in the second probe signal path between the input terminal and the second amplifier. A clamping circuit is in the second signal path between the second amplifier and the second output terminal and configured to clamp an internal probe signal, e.g. between an upper clamping threshold and a lower clamping threshold, to produce the second output signal.

主权项

1. A high-voltage active measurement probe for a measurement instrument, the high voltage active measurement probe comprising:
an input terminal configured to receive an input signal from a device under test (DUT); a first output terminal configured to transmit a first output signal to the measurement instrument for measurement and display of peak voltages; a second output terminal configured to transmit a second output signal to the measurement instrument for high sensitivity measurement and display of low level voltages; a first probe signal path between the input terminal and the first output terminal; a second probe signal path between the input terminal and the second output terminal; a first amplifier in the first probe signal path between the input terminal and the first output terminal; a second amplifier in the second probe signal path between the input terminal and the second output terminal; a first attenuator in the first probe signal path between the input terminal and the first amplifier; a second attenuator in the second probe signal path between the input terminal and the second amplifier; and a clamping circuit in the second signal path between the second amplifier and the second output terminal and configured to clamp an internal probe signal between an upper clamping threshold and a lower clamping threshold to produce the second output signal.