发明名称 ADSORPTION CHARACTERISTIC MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an adsorption characteristic measuring apparatus for accurately determining an adsorption isotherm below an extremely low relative pressure while keeping the form of a film compact or a compact.SOLUTION: An adsorption characteristic measuring apparatus 10 supplies a predetermined adsorption gas to a film compact 90 as a sample stored in a sample tube 80, and measures the adsorption characteristic. Into the sample tube 80, a granular filler 92 having a thermal conductivity higher than that of the adsorption gas below the measurement pressure is filled through a clearance between an inner wall surface of the sample tube 80 and the film compact 90. Furthermore, a glass rod 94 as a dead volume reduction rod material, a spacer ring 96 for forming a heat insulation space 97 between the granular filler 92 and the glass rod 94, and a reflector 98 for reflecting radiation heat are disposed.SELECTED DRAWING: Figure 1
申请公布号 JP2016061615(A) 申请公布日期 2016.04.25
申请号 JP20140188290 申请日期 2014.09.16
申请人 WASEDA UNIV;MICROTRACBEL CORP 发明人 MATSUKATA MASAHIKO;NAKAI KAZUYUKI;YOSHIDA MASAYUKI
分类号 G01N5/02 主分类号 G01N5/02
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