发明名称 COMPOUND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a compound semiconductor device and a manufacturing method and the like of the same, which can reduce contact resistance between a source electrode and a drain electrode.SOLUTION: A compound semiconductor device includes: a channel layer 102; a carrier supply layer 104 on the channel layer 102; a gate electrode 105g on the carrier supply layer 104; and a source electrode 105s including a first part 141s which sandwiches the channel layer 102 with the carrier supply layer 104, and a drain electrode 105d including a second part 141d which sandwiches the channel layer 102 with the carrier supply layer 104. The carrier supply layer 104 has a band gap larger than a band gap of the channel layer 102.
申请公布号 JP2015228459(A) 申请公布日期 2015.12.17
申请号 JP20140114330 申请日期 2014.06.02
申请人 FUJITSU LTD 发明人 TAGI TOSHIHIRO
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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