发明名称 |
REDUCING UNEQUAL BIASING IN SOLAR CELL TESTING |
摘要 |
A solar cell testing apparatus can include a first electrical probe configured to receive a first voltage at a first location of a solar cell. The solar cell testing apparatus can also include a second electrical probe configured to receive a second voltage at a second location of the solar cell, where the second location is of the same polarity as the first location. |
申请公布号 |
US2015318822(A1) |
申请公布日期 |
2015.11.05 |
申请号 |
US201414320475 |
申请日期 |
2014.06.30 |
申请人 |
Tu Xiuwen;Smith David D.;Soltz David Aitan |
发明人 |
Tu Xiuwen;Smith David D.;Soltz David Aitan |
分类号 |
H02S50/10;H02S50/15 |
主分类号 |
H02S50/10 |
代理机构 |
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代理人 |
|
主权项 |
1. A solar cell testing apparatus, comprising:
a first electrical probe configured to receive a first voltage at a first location of a solar cell; a second electrical probe configured to receive a second voltage at a second location of the solar cell, wherein the second location is of a same polarity as the first location. |
地址 |
San Jose CA US |