发明名称 ILLUMINATION SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
摘要 <p>A microlithographic projection exposure apparatus includes an illumination system and a projection objective. During use of the microlithographic projection exposure apparatus, the illumination system illuminates an object plane of the projection objective. The illumination system is configured so that light components in point-symmetrical relationship with each other, which are produced during use of the illumination system and which are only superposed in the object plane, have mutually orthogonal polarization states.</p>
申请公布号 KR20100106971(A) 申请公布日期 2010.10.04
申请号 KR20107013085 申请日期 2008.11.13
申请人 CARL ZEISS SMT AG 发明人 FIOLKA DAMIAN;BLAHNIK VLADAN
分类号 G03F7/20 主分类号 G03F7/20
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