发明名称 METHOD OF MANUFACTURING STACKED NANOWIRE MOS TRANSISTOR
摘要 Methods of manufacturing stacked nanowires MOS transistors are disclosed. In one aspect, the method includes forming a plurality of fins along a first direction on a substrate. The method also includes forming stack of nanowires constituted of a plurality of nanowires in each of the fins. The method also includes forming a gate stack along a second direction in the stack of nanowires, the gate stack surrounding the stack of nanowires. The method also includes forming source/drain regions at both sides of the gate stack, the nanowires between the respective source/drain regions constituting a channel region. A stack of nanowires may be formed by a plurality of etching back, laterally etching a trench and filling the trench. The laterally etching process includes isotropic dry etching having an internally tangent and lateral etching, and a wet etching which selectively etches along respective crystallographic directions.
申请公布号 US2015228480(A1) 申请公布日期 2015.08.13
申请号 US201514688788 申请日期 2015.04.16
申请人 Institute of Microelectronics, Chinese Academy of Sciences 发明人 Yin Huaxiang;Qin Changliang;Fu Zuozhen;Ma Xiaolong;Chen Dapeng
分类号 H01L21/02;H01L21/8234 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of manufacturing stacked nanowires MOS transistors, the method comprising: forming a plurality of fins along a first direction on a substrate; forming a stack of nanowires constituted of a plurality of nanowires in each of the fins; forming a gate stack along a second direction in the stack of nanowires, the gate stack surrounding the stack of nanowires; and forming source/drain regions at both sides of the gate stack, the nanowires between the respective source/drain regions constituting a channel region.
地址 Beijing CN