发明名称 Method of Growing Gallium Nitride-Based Crystal and Heat Treatment Apparatus
摘要 There is provided a method of growing a gallium nitride-based crystal, including: forming an interlayer including aluminum nitride or aluminum oxide on a silicon substrate at a film forming temperature of 350 to 700 degrees C.; heating the silicon substrate and the interlayer in an atmosphere containing ammonia or oxygen such that crystal nuclei of the aluminum nitride or the aluminum oxide included in the interlayer are distributed on the silicon substrate; and growing gallium nitride-based crystals on the silicon substrate from the crystal nuclei distributed on the silicon substrate.
申请公布号 US2015221512(A1) 申请公布日期 2015.08.06
申请号 US201514607591 申请日期 2015.01.28
申请人 TOKYO ELECTRON LIMITED 发明人 UMEZAWA Kota;WATANABE Yosuke
分类号 H01L21/02;C30B25/10 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of growing a gallium nitride-based crystal, comprising: forming an interlayer including aluminum nitride or aluminum oxide on a silicon substrate at a film forming temperature of 350 to 700 degrees C.; heating the silicon substrate and the interlayer in an atmosphere containing ammonia or oxygen such that crystal nuclei of the aluminum nitride or the aluminum oxide included in the interlayer are distributed on the silicon substrate; and growing gallium nitride-based crystals on the silicon substrate from the crystal nuclei distributed on the silicon substrate.
地址 Tokyo JP