| 摘要 |
This device for measuring a characteristic of a measurement object is provided with an elastic surface wave element. The elastic surface wave element is provided with: a comb shaped electrode for exciting an elastic wave and receiving a reflection based on the elastic wave the electrode being formed on the first surface of a piezoelectric substrate; a reflecting part having a third surface and a fourth surface; a reaction field formed between the comb shaped electrode and the reflecting part the reaction field being loaded with the measurement object; and a propagation part formed between the reflecting part and the second surface. The third surface of the reflecting part is formed between the comb shaped electrode and a second surface orthogonal to the first surface in the direction of propagation of the elastic wave the third surface being formed at a position different from the first surface in the direction of the normal to the first surface. The fourth surface connects the third surface and an end part of the first surface and is formed perpendicularly to the normal to the first surface. From the elastic wave propagated from the comb shaped electrode through the reaction field reflected by the fourth surface and received by the comb shaped electrode a characteristic of the measurement object is determined on the basis of an elastic surface wave isolated from a bulk wave included in the elastic surface wave reflected by the second surface and received by the comb shaped electrode. |
