| 发明名称 |
SYSTEMS AND METHODS FOR MEASURING CURRENT WITH SHIELDED CONDUCTORS |
| 摘要 |
Systems and methods for measuring current with shielded conductors are provided. One system includes a first wire within shielding, wherein the first wire is connected between a high voltage source and a filament of an x-ray system. The system also includes a second wire within shielding, wherein the second wire is connected between the high voltage source and the x-ray system and the shielding of the first and second wires is at a high voltage potential of the x-ray system. The system further includes a measurement resistor at a high voltage potential, wherein the measurement resistor is connected between the shielding and one of the first or second wires. |
| 申请公布号 |
US2015137795(A1) |
申请公布日期 |
2015.05.21 |
| 申请号 |
US201314095724 |
申请日期 |
2013.12.03 |
| 申请人 |
General Electric Company |
发明人 |
Wiedmann Uwe;Baptiste George William |
| 分类号 |
H05G1/26;G01R19/00 |
主分类号 |
H05G1/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measurement system comprising:
a first wire within shielding, the first wire connected between a high voltage source and a filament of an x-ray system; a second wire within shielding, the second wire connected between the high voltage source and the x-ray system, wherein the shielding of the first and second wires is at a high voltage potential of the x-ray system; and a measurement resistor having at least one end at the high voltage potential, the measurement resistor connected between the shielding and one of the first or second wires. |
| 地址 |
Schenectady NY US |
