发明名称 Semiconductor device and display device
摘要 A thin film transistor whose threshold voltage can be controlled and which has a favorable switching characteristic is provided. The thin film transistor includes a first gate electrode layer; a semiconductor layer; a first gate insulating layer provided between the first gate electrode layer and the semiconductor layer; source electrode and drain electrode layers which are provided over the semiconductor layer; a conductive layer covered by the first gate insulating layer and the semiconductor layer and provided so as to overlap with part of the first gate electrode layer; a second gate insulating layer provided so as to cover at least a back channel portion of the semiconductor layer; and a second gate electrode layer provided over the second gate insulating layer so as to overlap with the back channel portion of the semiconductor layer.
申请公布号 US9000441(B2) 申请公布日期 2015.04.07
申请号 US200912504897 申请日期 2009.07.17
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Kawae Daisuke;Kurokawa Yoshiyuki;Miyairi Hidekazu
分类号 H01L27/14;H01L29/786;H01L27/12;H01L29/04;H01L29/66 主分类号 H01L27/14
代理机构 Nixon Peabody LLP 代理人 Nixon Peabody LLP ;Costellia Jeffrey L.
主权项 1. A semiconductor device comprising: a first gate electrode layer over a substrate; a first gate insulating layer over the first gate electrode layer; a conductive layer over and in contact with the first gate insulating layer, the conductive layer overlapping the first gate electrode layer; a semiconductor layer over the conductive layer and the first gate insulating layer; a source electrode layer over the semiconductor layer, the source electrode layer overlapping a first portion of the first gate electrode layer; a drain electrode layer over the semiconductor layer, the drain electrode layer overlapping a second portion of the first gate electrode layer; a second gate insulating layer over the semiconductor layer; and a second gate electrode layer over the second gate insulating layer, the second gate electrode layer overlapping a third portion of the first gate electrode layer between the first portion and the second portion, wherein the semiconductor layer is in contact with the first gate insulating layer over the third portion of the first gate electrode layer.
地址 Kanagawa-ken JP