发明名称 |
ETCHING METHOD, ETCHING DEVICE, AND STORAGE MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To improve throughput in silicon oxide film etching processing which performs an alteration step and a heating step in the same chamber.SOLUTION: A silicon oxide film etching method comprises the steps of: generating a reaction product by supplying a halogen element-containing gas and a mixed gas containing a basic gas to a surface of the silicon oxide film and altering the silicon oxide film (alteration step); and removing the reaction product by heating (heating step). The silicon oxide film etching method performs the alteration step and the heating step in the same chamber. The heating step heats the reaction product by heating means for selectively heating the reaction product. |
申请公布号 |
JP2015056519(A) |
申请公布日期 |
2015.03.23 |
申请号 |
JP20130189224 |
申请日期 |
2013.09.12 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
MURAKI YUSUKE;KASAI SHIGERU;SUZUKI TOMOHIRO |
分类号 |
H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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