发明名称 Method of optical proximity correction for modifying line patterns and integrated circuits with line patterns modified by the same
摘要 A method of optical proximity correction executed by a computer system and integrated circuit layout formed by the same, the step of optical proximity correction comprises: providing an integrated circuit layout with a plurality of parallel line patterns, wherein one side of at least one line pattern is provided with a convex portion; and modifying the integrated circuit layout by forming a concave portion corresponding to the convex portion at the other side of the line pattern.
申请公布号 US8977988(B2) 申请公布日期 2015.03.10
申请号 US201313859718 申请日期 2013.04.09
申请人 United Microelectronics Corp. 发明人 Fang Kuan-Wen;Lin Chin-Lung;Tien Kuo-Chang;Lee Yi-Hsiu;Wang Chien-Hsiung
分类号 G06F17/50;G06K9/00 主分类号 G06F17/50
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A method of optical proximity correction executed by a computer system, comprising the steps of: providing an integrated circuit layout with a plurality of parallel line patterns and a plurality of interconnect patterns disposed corresponding to said parallel line patterns, wherein one side of each one of said parallel line patterns has a convex portion so that said convex portion overlaps a corresponding one of said interconnect patterns; and using the computer system to modify said integrated circuit layout by forming a concave portion based on a position of said interconnect pattern, wherein a position of the concave portion is corresponding to said convex portion at the other side of said line pattern with said convex portion.
地址 Science-Based Industrial Park, Hsin-Chu TW