发明名称 |
Method of optical proximity correction for modifying line patterns and integrated circuits with line patterns modified by the same |
摘要 |
A method of optical proximity correction executed by a computer system and integrated circuit layout formed by the same, the step of optical proximity correction comprises: providing an integrated circuit layout with a plurality of parallel line patterns, wherein one side of at least one line pattern is provided with a convex portion; and modifying the integrated circuit layout by forming a concave portion corresponding to the convex portion at the other side of the line pattern. |
申请公布号 |
US8977988(B2) |
申请公布日期 |
2015.03.10 |
申请号 |
US201313859718 |
申请日期 |
2013.04.09 |
申请人 |
United Microelectronics Corp. |
发明人 |
Fang Kuan-Wen;Lin Chin-Lung;Tien Kuo-Chang;Lee Yi-Hsiu;Wang Chien-Hsiung |
分类号 |
G06F17/50;G06K9/00 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A method of optical proximity correction executed by a computer system, comprising the steps of:
providing an integrated circuit layout with a plurality of parallel line patterns and a plurality of interconnect patterns disposed corresponding to said parallel line patterns, wherein one side of each one of said parallel line patterns has a convex portion so that said convex portion overlaps a corresponding one of said interconnect patterns; and using the computer system to modify said integrated circuit layout by forming a concave portion based on a position of said interconnect pattern, wherein a position of the concave portion is corresponding to said convex portion at the other side of said line pattern with said convex portion. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |