发明名称 SIGNAL PROCESSING SYSTEM WITH BIST FUNCTION, TESTING METHOD THEREOF AND TESTING SIGNAL GENERATOR
摘要 A signal processing system includes a module under test, an oscillation signal generator, a translational filter, and a testing module. The module under test has a signal input end. The oscillation signal generator generates an oscillation signal. The translational filter includes a mixer controlled by the oscillation signals. The mixer has a high-frequency side and a low-frequency side. The high-frequency side is coupled to the signal input end of the module under test. The testing module is coupled to the low-frequency side of the mixer. When the signal processing system is in a testing mode, the testing module provides a testing signal to the low-frequency side, so as to generate a high-frequency testing signal at the high-frequency side of the mixer.
申请公布号 US2014365841(A1) 申请公布日期 2014.12.11
申请号 US201414273985 申请日期 2014.05.09
申请人 MStar Semiconductor, Inc. 发明人 Yen Shih-Chieh;Hung Chih-Ming
分类号 G01R31/3177 主分类号 G01R31/3177
代理机构 代理人
主权项 1. A signal processing system, comprising: a module under test, having a signal input end; an oscillation signal generator, configured to generate an oscillation signal; a translational filter, comprising a baseband filtering circuit and a mixer that is controlled by the oscillation signal, the mixer having a high-frequency side and a low-frequency side, the high-frequency side being coupled to the signal input end of the module under test, the baseband filtering circuit being coupled to the low-frequency side; and a testing module, configured to provide a testing signal to the low-frequency side, so as to generate a high-frequency testing signal at the high-frequency side of the mixer.
地址 Hsinchu Hsien TW