| 摘要 |
<p>Disclosed are a test probe and a machining method of a test probe, the test probe including a plunger end part contacting a tested contact point, the plunger end part including a plurality of tips protruding toward the tested contact point, and at least one of the plurality of tips is a higher tip and at least another one of the plurality of tips is a lower tip that is lower than the higher tip.</p> |
