发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To secure a withstand voltage of a bit line connection transistor while suppressing an increase of a layout area of the bit line connection transistor.SOLUTION: An outside layout region R1 and an inside layout region R2 are provided in a layout region of a bit line connection circuit 9, bit line connection transistors are arranged in a matrix form in the outside layout region R1 and the inside layout region R2 so that a channel length direction coincides with a column direction, and a distance L3' in the channel length direction between a high concentration impurity diffusion layer 26 of each bit line connection transistor arranged in the outside layout region R1 and a corresponding element isolation region 22 is set longer than a distance L3 in the channel length direction between a high concentration impurity diffusion layer 26 of each bit line connection transistor arranged in the inside layout region R2 and a corresponding element isolation region 22.</p> |
申请公布号 |
JP2014187290(A) |
申请公布日期 |
2014.10.02 |
申请号 |
JP20130062307 |
申请日期 |
2013.03.25 |
申请人 |
TOSHIBA CORP |
发明人 |
AKAHO MASAYUKI;NOGUCHI MITSUHIRO;GOYO AKIMICHI;SUZUKI MASARU |
分类号 |
H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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