发明名称 IMPROVED FINFET
摘要 <p>A fin type transistor includes a dielectric layer on a substrate surface which serves to isolate the gate of the transistor from the substrate. The dielectric layer includes a non-selectively etched surface to produce top portions of fin structures which have reduce height variations across the wafer. The fin type transistor may also include a counter doped region at least below the S/D regions to reduce parasitic capacitance to improve its performance.</p>
申请公布号 SG10201403531S(A) 申请公布日期 2014.09.26
申请号 SG10201403531S 申请日期 2011.12.21
申请人 GLOBALFOUNDRIES SINGAPORE PTE. LTD. 发明人 TOH ENG HUAT;LEE JAE GON;TAN CHUNG FOONG;QUEK ELGIN
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