发明名称 POLISHING JIG, AND SAMPLE MOUNTING JIG FOR SETTING SAMPLE ON POLISHING JIG
摘要 PROBLEM TO BE SOLVED: To provide a polishing jig and a sample mounting jig that can perform control of a polishing amount and implement polishing work in a simple, efficient and economical manner.SOLUTION: A polishing jig 10 in which a sample 11 is held to be polished by abutting a sample lower end 12 against a grinder while maintaining the sample lower end 12 in parallel to the grinder, includes: a U-shaped jig body 17 having a pair of opposingly arranged arm members 14 and 15, and a coupling member 16 which connects a base side of each of the arm members 14 and 15; sample mounting means 19 which fixes the sample 11 on an aperture side of the coupling member 16 while the sample lower end 12 is projected downward; and level hold members 20 which penetrate a center part of the coupling member 16 and a tip side of the arm members 14 and 15 in a vertical direction respectively, and whose tip sides project from a lower face of the jig body 17 and are adjustable in projection length. The projection length of the level hold members 20 from the lower face of the jig body 17 is equal to a distance from the lower face of the jig body 17 to the sample lower end 12 or shorter by a preset distance.
申请公布号 JP2014155981(A) 申请公布日期 2014.08.28
申请号 JP20130027930 申请日期 2013.02.15
申请人 TAKADA CORP 发明人 KURATO KENJI;MASUTANI TOMOMICHI
分类号 B24B37/30 主分类号 B24B37/30
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