发明名称 |
SEMICONDUCTOR DEVICE DIELECTRIC INTERFACE LAYER |
摘要 |
Embodiments related to methods for forming a film stack on a substrate are provided. One example method comprises exposing the substrate to an activated oxygen species and converting an exposed surface of the substrate into a continuous monolayer of a first dielectric material. The example method also includes forming a second dielectric material on the continuous monolayer of the first dielectric material without exposing the substrate to an air break. |
申请公布号 |
US2014159170(A1) |
申请公布日期 |
2014.06.12 |
申请号 |
US201414183187 |
申请日期 |
2014.02.18 |
申请人 |
ASM IP Holding B.V. |
发明人 |
Raisanen Petri;Givens Michael;Verghese Mohith |
分类号 |
H01L29/51;H01L21/02 |
主分类号 |
H01L29/51 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a film stack on a substrate, the method comprising:
under vacuum conditions, exposing the substrate to a plasma activated oxygen species; converting an exposed surface of the substrate into a continuous monolayer of a first dielectric material; and forming a second dielectric material on the continuous monolayer of the first dielectric material without exposing the substrate to an air break.
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地址 |
Almere NL |