发明名称 Methods and structures for forming integrated semiconductor structures
摘要 <p>The invention provides methods and structures for fabricating a semiconductor structure and particularly for forming a semiconductor structure with improved planarity for achieving a bonded semiconductor structure comprising a processed semiconductor structure and a number of bonded semiconductor layers. Methods for forming semiconductor structures include forming a dielectric layer over a non-planar surface of a processed semiconductor structure, planarizing a surface of the dielectric layer on a side thereof opposite the processed semiconductor structure, and attaching a semiconductor structure to the planarized surface of the dielectric layer. Semiconductor structures include a dielectric layer overlaying a non-planar surface of a processed semiconductor structure, and a masking layer overlaying the dielectric layer on a side thereof opposite the processed semiconductor structure. The masking layer includes a plurality of mask openings over conductive regions of the non-planar surface of the processed semiconductor structure.</p>
申请公布号 KR101398084(B1) 申请公布日期 2014.05.23
申请号 KR20127021182 申请日期 2011.01.04
申请人 发明人
分类号 H01L21/98;H01L23/00 主分类号 H01L21/98
代理机构 代理人
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