| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus for distinguishing foreign surface features of an article from native surface features of the article.SOLUTION: Provided herein is an apparatus, including a photon detector array and processing means. The processing means is configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane, and photon-detector-array signals corresponding to a second set of photons scattered from surface features of an article focused in a second focal plane. The processing means is further configured for distinguishing foreign surface features of the article from native surface features of the article. |
