发明名称 Methods of implanting dopant ions
摘要 Methods of implanting dopant ions in a substrate include depositing a sacrificial material on a substrate. Dopant ions are implanted into the substrate while sputtering the sacrificial material, without substantially sputtering the substrate. Substantially no sacrificial material remains on the substrate after the implanting of the dopant ions. Some methods include forming a sacrificial material over a substrate and implanting dopant ions into the substrate while removing substantially all the sacrificial material from the substrate. Substantially no sputtering of the substrate occurs during the implanting of the dopant ions. Methods of doping a substrate include implanting dopant ions into a substrate having a sacrificial material thereon and sputtering the sacrificial material while implanting the dopant ions without substantially sputtering the substrate. Substantially no sacrificial material remains on the substrate after implanting the dopant ions.
申请公布号 US8709927(B2) 申请公布日期 2014.04.29
申请号 US201213618057 申请日期 2012.09.14
申请人 QIN SHU;LI LI;MICRON TECHNOLOGY, INC. 发明人 QIN SHU;LI LI
分类号 H01L21/425 主分类号 H01L21/425
代理机构 代理人
主权项
地址