发明名称 ZQ CALIBRATION CONTROL CIRCUIT AND METHOD FOR ZQ CALIBRATION BY THE SAME
摘要 PROBLEM TO BE SOLVED: To control a ZQ calibration additionally in an initial operation of a semiconductor memory device. SOLUTION: There is provided a ZQ calibration control circuit for a semiconductor memory device which includes a first signal generator, a second signal generator and a control unit. The first signal generator generates a pre-calibration signal during an initialization of the semiconductor memory device. The second signal generator generates ZQ calibration signals in response to a ZQ calibration command. The control unit controls a ZQ calibration in response to the pre-calibration signal and the ZQ calibration signals. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008228276(A) 申请公布日期 2008.09.25
申请号 JP20080003670 申请日期 2008.01.10
申请人 HYNIX SEMICONDUCTOR INC 发明人 KIM KIHO;PARK KEE-TEOK
分类号 H03K5/00;G11C11/401;G11C11/407;G11C11/4093;H03K5/14 主分类号 H03K5/00
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