发明名称 Testing device and testing method
摘要 A testing device includes a pressure vessel, a mounting stand disposed in an internal space of the pressure vessel, on which a device to be tested is mounted, test electrodes, disposed in the internal space of the pressure vessel, that supply a test voltage to the device to be tested mounted on the mounting stand, and a pressurization unit that raises the pressure of the internal space of the pressure vessel. The test voltage is supplied from the test electrodes to the device to be tested mounted on the mounting stand, and testing of the device to be tested is carried out, in a condition that the pressure of the internal space of the pressure vessel is raised by the pressurization unit.
申请公布号 US8610446(B2) 申请公布日期 2013.12.17
申请号 US201113067421 申请日期 2011.06.01
申请人 YOSHIDA ATSUSHI;TOYA HIROYUKI;NISHIZAWA TORU;UCHIYAMA SEIZO;FUJI ELECTRIC CO., LTD. 发明人 YOSHIDA ATSUSHI;TOYA HIROYUKI;NISHIZAWA TORU;UCHIYAMA SEIZO
分类号 G01R31/28 主分类号 G01R31/28
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