发明名称 METHOD FOR MANUFACTURING DOUBLE-LAYER POLYSILICON GATE
摘要 The invention discloses a method for manufacturing a dual-layer polysilicon gate. The method includes: depositing silicon nitride on silicon oxide of an integrated circuit to be processed; performing anisotropic etching on the silicon nitride to form sidewalls of silicon nitride on sidewalls of a first layer of polysilicon gate of the integrated circuit to be processed; manufacturing a second layer of polysilicon gate; and rinsing the sidewalls of silicon nitride.
申请公布号 US2013183821(A1) 申请公布日期 2013.07.18
申请号 US201213729338 申请日期 2012.12.28
申请人 PEKING UNIVERSITY FOUNDER GROUP CO., LTD.;FOUNDER MICROELECTRONICS INTERNATIONAL CO., LTD.;FOUNDER MICROELECTRONICS INTERNATIONAL CO., LTD.;PEKING UNIVERSITY FOUNDER GROUP CO., LTD. 发明人 PAN GUANGRAN
分类号 H01L29/40 主分类号 H01L29/40
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