发明名称 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
摘要 <p>A pattern forming method including: a process of forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin including a Repeating Unit (a1) having a group capable of being decomposed by acid and generating a carboxyl group, and a compound capable of generating acid through irradiation of actinic rays or radiation; a process of exposing the film; and a process of developing the exposed film using a developer including an organic solvent to form a negative tone pattern, wherein the value X obtained by substituting the number of each atom included in the Repeating Unit (a1) after being decomposed by acid and generating a carboxyl group in the following formula is 0< X<= 5. X=(total number of atoms configuring repeating unit after being decomposed by acid)/[(number of carbon atoms)-(number of atoms that are neither carbon atoms nor hydrogen atoms)]</p>
申请公布号 WO2013069811(A1) 申请公布日期 2013.05.16
申请号 WO2012JP79583 申请日期 2012.11.08
申请人 FUJIFILM CORPORATION;YAMAGUCHI, SHUHEI;TAKAHASHI, HIDENORI;SHIRAKAWA, MICHIHIRO;KATAOKA, SHOHEI;SAITOH, SHOICHI;YOSHINO, FUMIHIRO 发明人 YAMAGUCHI, SHUHEI;TAKAHASHI, HIDENORI;SHIRAKAWA, MICHIHIRO;KATAOKA, SHOHEI;SAITOH, SHOICHI;YOSHINO, FUMIHIRO
分类号 G03F7/038;G03F7/004;G03F7/039;G03F7/32;H01L21/027 主分类号 G03F7/038
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