发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A high-k capacitor insulating film stable at a higher temperature is formed. There is provided a method of manufacturing a semiconductor device. The method comprises: forming a first amorphous insulating film comprising a first element on a substrate; adding a second element different from the first element to the first amorphous insulating film so as to form a second amorphous insulating film on the substrate; and annealing the second amorphous insulating film at a predetermined annealing temperature so as to form a third insulating film by changing a phase of the second amorphous insulating film. The concentration of the second element added to the first amorphous insulating film is controlled according to the annealing temperature.
申请公布号 US2013122720(A1) 申请公布日期 2013.05.16
申请号 US201213713049 申请日期 2012.12.13
申请人 HITACHI KOKUSAI ELECTRIC INC.;HITACHI KOKUSAI ELECTRIC INC. 发明人 TAKEBAYASHI YUJI;YAMAZAKI HIROHISA;HORII SADAYOSHI;ITATANI HIDEHARU;OGAWA ARITO
分类号 H01L21/02 主分类号 H01L21/02
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