| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method capable of easily and accurately measuring an angle of a resonance end face of a semiconductor laser element. <P>SOLUTION: A semiconductor laser bar 2 including multiple semiconductor laser elements aligned in a direction of crossing an optical waveguide direction of an optical waveguide is fixed on a reference surface 21a of a stage 21 so that resonance end faces 2a are along a predetermined reference line 21b, a laser beam La is radiated from each of the resonance end faces of the multiple semiconductor laser elements in the semiconductor laser bar 2, an FFP (far field pattern) of the laser beam La is measured, and an angle of each of the resonance end faces of the semiconductor laser elements is calculated on the basis of a relative angle between a radiation direction of the laser beam La defined by a peak position of the FFP, and the predetermined reference line 21b and the reference surface 21a. <P>COPYRIGHT: (C)2013,JPO&INPIT |
