BUMP TEST GLASS PANEL TYPE BLOCK STRUCTURE OF THE PROBE

摘要

PURPOSE: A probe block structure is provided to perform more stable inspection when inspecting a display panel by improving an head block assembly structure configured in a probe unit, to improve an inspection speed thereby and to increase inspection stability through structural improvement and to improve production yield of a glass member block. CONSTITUTION: A probe block structure of a glass bump type for a panel test includes a buffer unit(120) arranged in a front end of a lower side of a body(111) comprising a head block(110), Ni bump type MEMS glass block(130) in which a conductive pattern contacting with a panel is formed while being formed to contact with the buffer unit, a connection unit(140) of which one side is connected to the conductive pattern of the Ni bump type MEMS glass block while of which the other side is connected to a driving IC(150) including an electrical circuitry function for panel inspection, FPCB(160) transmitting a test signal to the Ni bump type MEMS glass block while being connected to the driving IC and a fixing plate(170) for fixing all configurations to the lower side of the head block.