发明名称 Offset error automatic calibration integrated circuit
摘要 An integrated circuit includes a transducer and transducer circuitry and additional elements useful in testing the transducer and transducer circuitry. A first power supply terminal and a second power supply terminal are for being directly connected to an external power supply terminal. A power bus is connected to the first power supply terminal. A logic function is for determining if the second power supply terminal is receiving power and if an automatic calibration test of the transducer and transducer circuitry has been run. An automatic calibration is for running an automatic calibration test on the transducer and transducer circuitry if the logic means determines that the second power supply terminal is receiving power and the automatic calibration test of the transducer and transducer circuitry has not been run.
申请公布号 US8321170(B2) 申请公布日期 2012.11.27
申请号 US20100709063 申请日期 2010.02.19
申请人 SCHULTZ PETER S.;JO SUNG-JIN;FREESCALE SEMICONDUCTOR, INC. 发明人 SCHULTZ PETER S.;JO SUNG-JIN
分类号 G01D18/00;G06F19/00 主分类号 G01D18/00
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