| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test device for a switching device and the test method thereof, in which the number of tests is halved and a cutoff test of a switching device in a worn state of contacts in accordance with the number of powering-on can be conducted by conducting an opening/closing test in a series of operation duties without dividing the test into a powering-on test and a cutoff test. <P>SOLUTION: In a test device for a switching device, using a capacitor 2 as a power source, another capacitor 4 other than the capacitor 2 is charged. To one of electrodes of a sample switching device 1 in an open circuit state, a direct current voltage equivalent to the rated voltage peak value of the sample switching device is applied. The switching device test device comprises: a power circuit for supplying inrush current that connects with an oscillation circuit composed of the capacitor 2, a reactor 3, and a resistor 6 and supplies a high-frequency inrush current to the sample switching device 1 by powering on the sample switching device 1; a power circuit for supplying alternating current that supplies an alternating current from a generator 12 through a resistor; and a power circuit for supplying a recovery voltage after cutoff of the alternating current that lets a transformer increase the voltage of the generator and applies the increased voltage to the one electrode of the sample switching device through the resistor and the capacitor. <P>COPYRIGHT: (C)2013,JPO&INPIT |
