发明名称 |
Thin film memory device having a variable resistance |
摘要 |
A thin film storage device includes a first electrode (3), a first variable resistance thin film (2), and a second electrode (1). The first electrode (3) is formed over a surface of a substrate (4). The first variable resistance thin film (2) is formed over a surface of the first electrode (3). The second electrode (1) is formed over a surface of the first variable resistance thin film (2). The first variable resistance thin film (2) comprises a material whose resistance in a bulk state changes in accordance with at least one of a lattice strain and a change of charge-order. |
申请公布号 |
US8263961(B2) |
申请公布日期 |
2012.09.11 |
申请号 |
US20040578521 |
申请日期 |
2004.10.22 |
申请人 |
OSANO KOICHI;MURAOKA SHUNSAKU;SAKAKIMA HIROSHI;PANASONIC CORPORATION |
发明人 |
OSANO KOICHI;MURAOKA SHUNSAKU;SAKAKIMA HIROSHI |
分类号 |
H01L45/00;G11C11/34;G11C16/02 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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