发明名称 Thin film memory device having a variable resistance
摘要 A thin film storage device includes a first electrode (3), a first variable resistance thin film (2), and a second electrode (1). The first electrode (3) is formed over a surface of a substrate (4). The first variable resistance thin film (2) is formed over a surface of the first electrode (3). The second electrode (1) is formed over a surface of the first variable resistance thin film (2). The first variable resistance thin film (2) comprises a material whose resistance in a bulk state changes in accordance with at least one of a lattice strain and a change of charge-order.
申请公布号 US8263961(B2) 申请公布日期 2012.09.11
申请号 US20040578521 申请日期 2004.10.22
申请人 OSANO KOICHI;MURAOKA SHUNSAKU;SAKAKIMA HIROSHI;PANASONIC CORPORATION 发明人 OSANO KOICHI;MURAOKA SHUNSAKU;SAKAKIMA HIROSHI
分类号 H01L45/00;G11C11/34;G11C16/02 主分类号 H01L45/00
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