发明名称 Phase Change Memory Cell Structure
摘要 A memory cell described herein includes a memory element comprising programmable resistance memory material overlying a conductive contact. An insulator element includes a pipe shaped portion extending from the conductive contact into the memory element, the pipe shaped portion having proximal and distal ends and an inside surface defining an interior, the proximal end adjacent the conductive contact. A bottom electrode contacts the conductive contact and extends upwardly within the interior from the proximal end to the distal end, the bottom electrode having a top surface contacting the memory element adjacent the distal end at a first contact surface. A top electrode is separated from the distal end of the pipe shaped portion by the memory element and contacts the memory element at a second contact surface, the second contact surface having a surface area greater than that of the first contact surface.
申请公布号 US2012187362(A1) 申请公布日期 2012.07.26
申请号 US201213436203 申请日期 2012.03.30
申请人 LEE MING-HSIU;CHEN CHIEH-FANG;MACRONIX INTERNATIONAL CO., LTD. 发明人 LEE MING-HSIU;CHEN CHIEH-FANG
分类号 H01L45/00 主分类号 H01L45/00
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