| 摘要 |
[PROBLEM] To provide a Kelvin contact probe, which can be applied to a narrow pitch of electrodes, irrespective of the shape of the electrodes of a subject to be inspected, and which, furthermore, can eliminate a manufacture cost increase of a circuit board, and to provide a Kelvin inspection jig provided with the Kelvin contact probe. A Kelvin inspection jig (100) is provided with contact probes (10, 20), a contact probe (10) is provided with an electrode-side contact terminal (11) that is to be brought into contact with a solder ball (61), and a land-side contact terminal (12) that is to be brought into contact with a land (71). A contact probe (20) is provided with an electrode-side contact terminal (21) to be brought into contact with the solder ball (61), and a land-side contact terminal (22) to be brought into contact with a land (72). The contact probes (10, 20) are disposed such that the electrode-side tilted surface (11a) and the electrode-side tilted surface (21a) face opposite sides, and that the land-side tilted surface (12a) and the land-side tilted surface (22a) face each other. |
