发明名称 METHOD OF FORMING Ge-Sb-Te FILM, AND STORAGE MEDIUM
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of forming a Ge-Sb-Te film which is highly controllable due to the CVD and by which a highly smooth Ge-Sb-Te film can be obtained. <P>SOLUTION: The method of forming the Ge-Sb-Te film by arranging a substrate in a processing chamber and introducing a gaseous Ge material, a gaseous Sb material, and a gaseous Te material into the processing chamber to form the Ge-Sb-Te film, which will be Ge<SB POS="POST">2</SB>Sb<SB POS="POST">2</SB>Te<SB POS="POST">5</SB>, on the substrate by the CVD, includes: the step (Step 2) of introducing the gaseous Ge material and the gaseous Sb material, or an amount of gaseous Te material small enough not to form Ge<SB POS="POST">2</SB>Sb<SB POS="POST">2</SB>Te<SB POS="POST">5</SB>in addition to them, into the processing chamber to form a precursor film containing no Te or a smaller amount of Te than Ge<SB POS="POST">2</SB>Sb<SB POS="POST">2</SB>Te<SB POS="POST">5</SB>on the substrate; and the step (Step 3) of introducing the gaseous Te material into the processing chamber and letting the precursor film absorb Te to adjust a Te concentration in the film. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012072455(A) 申请公布日期 2012.04.12
申请号 JP20100218529 申请日期 2010.09.29
申请人 TOKYO ELECTRON LTD 发明人 KONO YUMIKO;ARIMA SUSUMU
分类号 C23C16/455;C23C16/30;H01L27/105;H01L45/00 主分类号 C23C16/455
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