发明名称 MEMORY ELEMENT AND MEMORY DEVICE
摘要 A memory element and a memory device with improved controllability over resistance change by applied voltage are provided. The memory element includes a first electrode, a memory layer, and a second electrode in this order. The memory layer includes a resistance change layer provided on the first electrode side, and an ion source layer provided on the second electrode side and is higher in resistance value than the resistance change layer. A resistance value of the resistance change layer is changeable in response to a composition change by applied voltage to the first and second electrodes
申请公布号 US2012008370(A1) 申请公布日期 2012.01.12
申请号 US201113164956 申请日期 2011.06.21
申请人 SONY CORPORATION 发明人 YASUDA SHUICHIRO;SEI HIROAKI;KOUCHIYAMA AKIRA;SHIMUTA MASAYUKI;YAMADA NAOMI
分类号 G11C11/21;H01L45/00 主分类号 G11C11/21
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