发明名称 |
LIGHT INTENSITY MEASUREMENT METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To precisely measure extremely small input light intensity affected largely by dark current of an APD in a light intensity measurement method in which the APD is used. <P>SOLUTION: The light intensity measurement method for measuring intensity of input light received by the APD 11 includes: a first step of measuring the amount of dark current of the APDs 11 under a plurality of ambient temperatures; a second step in which the input light is made incident on the APDs 11 and the amount of output current of the APDs 11 is measured; and a third step of obtaining the intensity of the input light by obtaining a value obtained by subtracting the amount of dark current corresponding to the ambient temperature in the second step from the amount of output current. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011252716(A) |
申请公布日期 |
2011.12.15 |
申请号 |
JP20100124822 |
申请日期 |
2010.05.31 |
申请人 |
SUMITOMO ELECTRIC DEVICE INNOVATIONS INC |
发明人 |
MURAYAMA SATORU;ICHINO MORIYASU |
分类号 |
G01J1/42;H01L31/10;H01L31/107 |
主分类号 |
G01J1/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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