| 摘要 |
A system is described for obtaining images of a gemstone, and performing quantitative analysis on the images to obtain measures of properties of the gemstone. The system comprises a support structure for supporting the gemstone at an observation position. An illumination structure is arranged to illuminate the gemstone. The illumination structure comprises a plurality of radially dispersed directional light sources directed towards the observation position, the support structure and illumination system being rotatable relative to one another around a rotation axis so that the gemstone can be illuminated by one or more of the directional light sources at each of a plurality of rotational positions, the axis of rotation being normal to a selected facet of the gemstone. An imaging device is directed towards the gemstone for obtaining images of the gemstone at each of the rotational positions, the imaging device having an imaging axis parallel to or coincident with the axis of rotation. An image processor is provided for identifying sparkle regions in the images corresponding to reflections from individual light sources by individual facets and providing a quantitative measure of the gemstone on the basis of properties of the sparkle regions. |
